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SOLVER NEXT, the First Fully Integrated Dual Head AFM/STM, wins coveted 2009 R&D 100 award

24.08.2009

SOLVER NEXT, Winner of the coveted
2009 R&D 100 award

NT-MDT is proud to announce that its new SOLVER NEXT has received the coveted R&D 100 award. This prestigious and long-standing annual award recognizes the top 100 new technologies from the past year, across a broad range of industries.

SOLVER NEXT’s novel architecture presents the first commercial scanning probe microscope featuring both Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM) under one hood. Built and priced especially for university labs and routine industrial applications, SOLVER NEXT provides the flexibility and versatility of over 40 different measurement modes, without the need for advanced training required to run most scanning probe instruments. The full system, including sample loading, can be run remotely, making it ideal for telemicroscopy as well as hazardous environments such as nuclear facilities.

In another industry first, SOLVER NEXT runs Windows using the MAC hardware and operating system. MAC’s have long been known for their exceptional image management and operating stability while the Windows platform is better known for the broad range of available applications. This system combines the best of both worlds. In addition, NT-MDT has cleverly added an iPhone MAC applet so that images, including dynamic 3D presentations, can readily be shared on-site or emailed to colleagues and fellow students. The applet also includes simple measurements such as length, depth, and average surface roughness.

iPhoneT application allowing to view,
save and transfer scan images
with the mobile phone

SOLVER NEXT is specifically designed with simplicity in mind. The sample is placed on the scanning stage located between the two heads. With the click of a mouse, the head of choice automatically moves into position; the cantilever, laser and photodiode are automatically aligned; and the image is acquired. A second click of the mouse can switch from one measurement head to the other. An additional docking port supports a third microscope head, either for nanoindentation or measurement in liquid.

SOLVER NEXT will be on display this Fall at the Materials Research Society meeting as well as the American Society for Cell Biology.