NTEGRA platform

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NTEGRA catalog  (8 Mb); Unique SPM solutions  (707 Kb)

Scanning Probe Microscopy gives an opportunity to carry out studies of spatial, physical and chemical properties of objects with the typical dimensions of less than a few nanometers. Owing to its multifunctionality, availability and simplicity, Atomic-Force Microscope (AFM) has become one of the most prevailing “tools for nanotechnology” nowadays. NTEGRA platform has been designed as the special base for the constantly developing options of Scanning Probe Microscopy that combines them with various other modern research methods. The model series includes devices for carrying out probe-microscopy experiments in the common and specific conditions: vacuum, liquids, low and high temperatures, etc. The combination of AFM and other methods has given an opportunity of going beyond the optical limits and carry out spectral researches (e.g. chemical analysis) with the resolution that tops the best optical methods.

NTEGRA Prima
The basic system that gives an opportunity of studying physical properties of the surface, using almost any available SPM method with atomic-molecular resolution. It serves as the basis for the creation of more specialized systems.

NTEGRA Spectra
Integration of SPM and confocal microscopy/Raman scattering spectroscopy. Owing to the effect of giant amplification of Raman scattering (TERS – Tip Enhances Raman Scattering) it allows carrying out spectroscopy studies and obtaining images with 50nm resolution.

NTEGRA Aura
SPM for the research in the controlled gas and in low vacuum environments. Specialization – measuring light forces (electric, magnetic, adhesive, etc.)

NTEGRA Therma
SPM with unprecedented low level of thermal drifts (less than 10 nm/ °C). It allows carrying out precise manipulations on very small fields (<100nm) and put into practice long-term measurements of single nanoobjects. It provides extremely high stability of measurements in the terms of changing temperature. Build-in Nova PowerScript macro language for automated system management allows carrying out unique experiments.

NTEGRA Solaris
Scanning near-field optical microscope (SNOM). Specialization – investigation of optical properties beyond the limit of a visible light diffraction (resolution of 30 nm).

NTEGRA Life
Integration of SPM and inverted microscope. Specialization – molecular and cellular examinations of biological objects in the environment close to the physiological one.

NTEGRA Tomo
Integration of SPM and ultra microtome. It allows obtaining layer-by-layer images of the sample and reconstructing a 3D model of nanosized inclusions. It can complete TEM data obtained on the same sample slices.

NTEGRA Maximus
SPM for the study of large (up to 100mm) samples. It allows carrying out serial measurements in the semi-automatic mode.