AFAM

Atomic-Force Acoustic Microscopy (AFAM) method allows imaging and measuring quantitatively local differences in the elasticity of polymer materials and polymer products. In contrast to SPM methods, e.g. phase imaging, force modulation, etc., AFAM gives an opportunity of comparing the Young modulus value in a much wider range, i.e. one can measure rather hard and soft materials simultaneously. There are two modes of AFAM work: phase measuring or measuring of amplitude of cantilever’s bending oscillations near the resonance frequency simultaneously with relief registration using contact method.

Fig.1 Transducer

There are two modes of AFAM work: phase measuring or measuring of amplitude of cantilever’s bending oscillations near the resonance frequency simultaneously with relief registration using contact method.


Rhombic crystals of polyethylene on the mica substrate. Contact method topography (left) and AFAM image (right). Scan size 7x7 µm.

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Stripes of low and high density polyethylene with different elasticity.

Topography
AFAM amplitude
Force Modulation
Phase images and Young Modulus map
Scan size 47x47 µm.

Composite protein film. AFAM image areas with different components. Scan size 3x3 µm.

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Polished PZT samples of 1 mm thickness. 1 - Contact Topography, 2 – Force Modulation, 3- Phase Imaging, 4 – AFAM images of stripe ferroelectric domains. Scan size 4x4 µm.